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 凱思隆科技股份有限公司多年來致力於提供半導體、電子相關產業「點針量測之完整解決方案」。
主要的營業項目包括：
KeithLink Technology Co., Ltd. has been providing "Probing and Measurement Solutions for a global society" as our company business direction.
The company’s business mainly covers:
手動探針台/探針座
各式量測應用之探針台/探針座，適用於：晶圓(直流電性、或高頻)量測；液晶面板量測；觸控面板ITO薄膜、導電高分子薄膜、矽晶片、太陽能電池薄膜、金屬薄膜等，各種薄膜的四點探針片電阻率導電度量測；太陽能電池薄膜量測；軟性顯示面板量測；霍爾效應量測；以及客製化的量測需求。
Self Manufactured Manual Prober (Probe Station/Micromanipulator)
The prober covers a variety of applications, such as wafer (DC or RF) measurement, LCD Panel measurement, Four Point Sheet / Resistivity / Conductivity measurement for film, such as ITO/PET or ITO/Glass on touch panel, conductive polymer, silicon wafer, thin film solar cell, metal film, and others. It also applies to Solar Cell measurement, Flexible Display Measurement, Hall Effect Measurement, and customized measurement.
 Keithley 儀器軟硬體系統整合服務
提供Keithley量測儀器與客製化的量測程式。例如：MOSFET I-V、四點探針片電阻、溫度電阻、太陽能電池效率…等量測程式。並整合手動探針台，提供元件特性量測的整合服務。
Keithley Instrument and system integrator
Keithley Instrument as well as keithley instrument based software are provided, developed, such as MOSFET I-V, Four Point Sheet Resistivity, Temperature-Resistance, Solar Cell Efficiency, etc., and integrated with manual prober as the total solution for device characterization measurement in the fields of Semiconductor and Electronics.
 PLED/OLED 功能性測試系統
發光強度-電流-電壓（LIV）量測系統、壽命週期測試系統、及光電測試系統，可方便進行OLED（PLED）、有機太陽能電池、有機感測器等元件的特性分析、壽命週期參數測試、與製程中缺陷分析。
PLED/OLED Test Systems
Luminance-Current-Voltage (LIV) measurement system, Lifetime test system, and Photoelectric test system for device characteristics, lifetime parameters, and defect analysis of Organic Light Emitting Diodes (OLEDs) , Organic Solar Cells (OPVs) and Organic Sensors.
元件特性量測服務
考量客戶預算有限，提供諮詢顧問，與量測代工服務。可以代為進行：
(1) 低電流電壓量測
(2) 四點探針電阻率量測
(3) 接觸阻抗量測
(4) 霍爾電壓量測
(5) 電容–電壓 (C-V) 測試
(6) 脈衝電流電壓測試
(7) LCD 面板點燈檢測服務
Device Characterization Measurement Service
Consulting and providing the measurement services for the customer with limited budget.
(1) Low Current/Low Voltage Measurement
(2) Four Point Resistivity Measurement
(3) Contact Resistance Measurement
(4) Hall Effect Voltage Measurement
(5) Capacitance, Voltage Measurement
(6) Pulse IV Measurement
(7) LCD Panel/LCM Panel Light Up Inspection and Measurement Service
探針卡維修服務
探針調校、共同平整度、研磨與蝕刻等探針卡的維修服務。
Probe Card Maintenance
Probe Needle Services of alignment, co planarity, grinding, and etching for probe card maintenance.
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