Low Resistance Four-Point Probe Measurement System

• The X-Y sample slide table can be moved manually and quickly / fine-tuned to measure the position at a fixed point
• Can carry out a general linear four-point probe with Houle Van Der Paul Mode, extraction resistance, chip resistance, resistivity and conductivity
• Resistance measurement modes support DC, scan, positive and negative voltage (Delta) , and (PWM) low heat and voltage compensation for accurate measurement
• Signal anti-noise processing from the tip to the instrument input electromagnetic wave shielding to improve SNR
• Different probes are selected according to the material properties of the samples