Hall Effect Probing Measurement System / Hall Effect Prober / Hall Effect Probe Station / Hall prober with electromagnets

By Van Der Pauw connections and method, this Hall effect measurement system can measure semiconductor parameters, such as carrier mobility and carrier concentration,Hall coefficient, electrical conductivity and conductivity type. Contribute to characterization of semiconductor materials and components, widely used in non-contact measurement applications.

[Feature]

magnetic intensity more than 5000 Gauss

● Hall effect prober main body

● Sample holder plate adaptive to 1*1cm/2*2cm

● Magnetic intensity in Gauss measureable

● Magnet intensity adjustable

● Magnet POS/NEG adjustable

● Equipped with 4 micropositioners

● Input blanks for sourcing current, magnetic field in Gauss and known thickness d
● Extract sheet resistance Rs, volume resistivity Pv, sheet carrier density ns, bulk carrier density n and mobility u
● Various measurement condition selections for accurate signal extraction
● Measured data on-line display and storable
● Shielding box (Option)