Multi-angle adjustable double TLP tip Micropositioner

The probe holder carries two pins (Signal/Ground or Signal/Signal) at the same time to simultaneously lower the needle on the I/O electrodes at two different positions. With the distance, height, and I/O electrode position of the object to be tested, the probe holder has the following multi-dimensional (multi-angle) adjustment function:

• The double needle depends on the position of the I/O electrode of the object to be tested, and different inclination angles can be independently performed.
• The double needle can be adjusted according to the height of the object to be tested, and the length of the telescopic length can be adjusted individually.
• The double needle can be moved linearly and individually according to the position of the I/O electrode of the object to be tested.
• The double needle is used to make X-Y-Z linear movement and curve angle together with the probe holder (the function commonly used by RF high-frequency probes) to swing the lower needle.